Lachmann, R., Schulze, S., Nieke, M., Seidl, C., & Schaefer, I. (2016, December). System-Level Test Case Prioritization Using Machine Learning. 2016 15th IEEE International Conference on Machine Learning and Applications (ICMLA), 361-368. https://doi.org/10.1109/ICMLA.2016.0065
Chicago Style (17th ed.) CitationLachmann, Remo, Sandro Schulze, Manuel Nieke, Christoph Seidl, and Ina Schaefer. "System-Level Test Case Prioritization Using Machine Learning." 2016 15th IEEE International Conference on Machine Learning and Applications (ICMLA) Dec. 2016: 361-368. https://doi.org/10.1109/ICMLA.2016.0065.
MLA (9th ed.) CitationLachmann, Remo, et al. "System-Level Test Case Prioritization Using Machine Learning." 2016 15th IEEE International Conference on Machine Learning and Applications (ICMLA), Dec. 2016, pp. 361-368, https://doi.org/10.1109/ICMLA.2016.0065.