Application and operation of a superconducting sampler based instrumentation system

A superconducting sampler system with a self-triggering mechanism achieved a 70-GHz bandwidth, 5-ps rise time resolution, 20- mu V r.m.s. (root mean square) noise floor, less than 1-ps jitter, and an 8-mV, 70-GHz triggering capability. The sampler was used for studying ion-induced SEU (single-event-...

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Bibliographic Details
Published in7th IEEE Conference on Instrumentation and Measurement Technology pp. 255 - 258
Main Authors Hanson, E., Shen, Z.-Y.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1990
Subjects
Bandwidth
Diodes
Gallium arsenide
Jitter
MESFETs
Root mean square
Sampling methods
Silicon
Superconducting device noise
Superconducting microwave devices
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Summary:A superconducting sampler system with a self-triggering mechanism achieved a 70-GHz bandwidth, 5-ps rise time resolution, 20- mu V r.m.s. (root mean square) noise floor, less than 1-ps jitter, and an 8-mV, 70-GHz triggering capability. The sampler was used for studying ion-induced SEU (single-event-upset) transient phenomena in silicon diodes and GaAs MESFETs. Compared with conventional methods, the superconducting sampling system is easy to use and provides superior capabilities. An SEU transient has been measured with a record 25-ps rise time. The superconducting sampler configured as a TDR (time-domain reflectometer) has achieved a 2.5-ps rise time at the I/O interface after deconvolution. This corresponds to a 0.375-mm spatial resolution. It is concluded that the TDR can provide useful information for improving the performance of microwave and millimeter-wave devices.< >
DOI:10.1109/IMTC.1990.66012