A trial scanning atom probe and field distribution at a tip apex of a micro-tip array
Summary form only given, as follows. A trial scanning atom probe (SAP) was constructed by modifying a low temperature UHV scanning tunneling microscope (STM). The specimen holder of the conventional STM was replaced with a holder of an extraction electrode made of a 10 micrometer thick Pt foil. The...
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Published in | 9th International Vacuum Microelectronics Conference p. 668 |
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Main Authors | , , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
1996
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Subjects | |
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Abstract | Summary form only given, as follows. A trial scanning atom probe (SAP) was constructed by modifying a low temperature UHV scanning tunneling microscope (STM). The specimen holder of the conventional STM was replaced with a holder of an extraction electrode made of a 10 micrometer thick Pt foil. The specimen micro-tip array is mounted at one end of a piezo tube which allows one to move the specimen with subnanometer precision. Silver foils connecting the cold end of the cryogenic refrigerator and the holder of the piezo tube cool the specimen and piezo assembly down to 50 K. Field emitted electrons and field ionized gas ions project images of an individual tip apex of a micro-tip array at atomic resolution and field evaporated apex atoms fly into the flight space of a reflectron mass analyzer through the probe hole at the center of the screen. The results of preliminary experiments are reported. While constructing the SAP, the field distributions around the tip apex were computed in order to examine the variation of field emitted current with the relative position of the tip apex and the open hole of the extraction electrode. The calculated field distribution is presented, comparing the observed variation of emitted current with the relative positions. |
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AbstractList | Summary form only given, as follows. A trial scanning atom probe (SAP) was constructed by modifying a low temperature UHV scanning tunneling microscope (STM). The specimen holder of the conventional STM was replaced with a holder of an extraction electrode made of a 10 micrometer thick Pt foil. The specimen micro-tip array is mounted at one end of a piezo tube which allows one to move the specimen with subnanometer precision. Silver foils connecting the cold end of the cryogenic refrigerator and the holder of the piezo tube cool the specimen and piezo assembly down to 50 K. Field emitted electrons and field ionized gas ions project images of an individual tip apex of a micro-tip array at atomic resolution and field evaporated apex atoms fly into the flight space of a reflectron mass analyzer through the probe hole at the center of the screen. The results of preliminary experiments are reported. While constructing the SAP, the field distributions around the tip apex were computed in order to examine the variation of field emitted current with the relative position of the tip apex and the open hole of the extraction electrode. The calculated field distribution is presented, comparing the observed variation of emitted current with the relative positions. |
Author | Numada, Y. Iwatsuki, M. Ishikawa, Y. Aoki, S. Nishikawa, O. |
Author_xml | – sequence: 1 givenname: O. surname: Nishikawa fullname: Nishikawa, O. organization: Dept of Mater. Sci. & Eng., Kanazawa Inst. of Technol., Ishikawa, Japan – sequence: 2 givenname: Y. surname: Numada fullname: Numada, Y. – sequence: 3 givenname: M. surname: Iwatsuki fullname: Iwatsuki, M. – sequence: 4 givenname: S. surname: Aoki fullname: Aoki, S. – sequence: 5 givenname: Y. surname: Ishikawa fullname: Ishikawa, Y. |
BookMark | eNp9jkEPwUAUhDdBQnEXp_cHWrtWyx5FCAc3XJtHt_Kk3W12K9F_r8HZXCYz8x0mYF1jjWZsIngkBFezw-W4iYRSSZRwoeaywwK-XHEpY7WI-2zs_YO3WsSx5HzAzmuoHWEB_obGkLkD1raEytmrBjQZ5KSLDDLyLXZ91mRNSwBCTRVgpV9g8zaVdHM2_HTOYTNivRwLr8c_H7Lpbnva7EPSWqeVoxJdk34Pyr_jG6z4QMM |
ContentType | Conference Proceeding |
DBID | 6IE 6IL CBEJK RIE RIL |
DOI | 10.1109/IVMC.1996.601923 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE/IET Electronic Library IEEE Proceedings Order Plans (POP All) 1998-Present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEL url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
ExternalDocumentID | 601923 |
Genre | teaser-abstract |
GroupedDBID | 6IE 6IK 6IL AAJGR ACGHX ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK OCL RIE RIL |
ID | FETCH-ieee_primary_6019233 |
IEDL.DBID | RIE |
ISBN | 0780335945 9780780335943 |
IngestDate | Wed Jun 26 19:28:49 EDT 2024 |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-ieee_primary_6019233 |
ParticipantIDs | ieee_primary_601923 |
PublicationCentury | 1900 |
PublicationDate | 19960000 |
PublicationDateYYYYMMDD | 1996-01-01 |
PublicationDate_xml | – year: 1996 text: 19960000 |
PublicationDecade | 1990 |
PublicationTitle | 9th International Vacuum Microelectronics Conference |
PublicationTitleAbbrev | IVMC |
PublicationYear | 1996 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0000455300 |
Score | 2.5183477 |
Snippet | Summary form only given, as follows. A trial scanning atom probe (SAP) was constructed by modifying a low temperature UHV scanning tunneling microscope (STM).... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 668 |
SubjectTerms | Atomic measurements Cryogenics Electrodes Joining processes Microscopy Probes Refrigeration Silver Temperature Tunneling |
Title | A trial scanning atom probe and field distribution at a tip apex of a micro-tip array |
URI | https://ieeexplore.ieee.org/document/601923 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3LSgMxFA22K1e-Klof3IXbmWaaZMwspViqUHFhpbuS14BIZ4Z2BtSvN49pRenCXRKGcCED5-bmnHMRuiG5hSHGhf15NY4s4qlIEskjlipOsHFZhisNTJ_SyYw-ztm89dn2WhhjjCefmdgN_Vu-LlXjSmWD1OcjHdTheBikWttyis1MGMHYX8w5JoRllLX-Ops52bxS4mzw8DodOaFeGoc9f_VW8dAyPgia7bV3JHSMkve4qWWsvv74Nf4z6kPU-9HwwfMWnY7QnilO0OwOfJsOWKvQqwjsnXsJrquMAVFo8IQ20M5Nt22EZb8AAfVbBaIyH1DmdrZ0LL7Ir61W4rOH-uP7l9EkclEtquBfsQgBkVPULcrCnCHINeU0uU1xrjiVGZXJUMlMaG7zuVwmyTk63rFBf-fqBdoPxGZXpbhE3XrVmCuL27W89if2DZ4el8U |
link.rule.ids | 310,311,786,790,795,796,802,4069,4070,27958,55109 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1NS8NAEB20HvTkV8XWrzl4Tbpxk7g5SrGk2hYPrfRWspsNiDQJaQrqr3c_2orSg7fdJSwDG3izs--9AbilmYKhgCXq502JoxBPOJxy5gShYJRInWXo0sBwFMYT_2kaTFc-20YLI6U05DPp6qF5y08LsdSlsk5o8pFd2FMwTyIr1toUVFRuElBCzNWcEUqDyA9WDjvrOV2_U5Ko038ddrVUL3Ttrr-6qxhw6R1a1fbCeBJqTsm7u6y5K77-ODb-M-4jaP6o-PBlg0_HsCPzU5g8oGnUgQthuxWhunXPUfeVkZjkKRpKG6baT3fVCkt9gQnWbyUmpfzAIlOzuebxOWatqpLPJrR7j-Nu7OioZqV1sJjZgOgZNPIil-eAWeoz37sPSSaYzyOfe3eCR0nKVEaXcc9rwcmWDdpbV29gPx4PB7NBf_R8AQeW5qxrFpfQqKulvFIoXvNrc3rf0pebGw |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=9th+International+Vacuum+Microelectronics+Conference&rft.atitle=A+trial+scanning+atom+probe+and+field+distribution+at+a+tip+apex+of+a+micro-tip+array&rft.au=Nishikawa%2C+O.&rft.au=Numada%2C+Y.&rft.au=Iwatsuki%2C+M.&rft.au=Aoki%2C+S.&rft.date=1996-01-01&rft.pub=IEEE&rft.isbn=9780780335943&rft.spage=668&rft_id=info:doi/10.1109%2FIVMC.1996.601923&rft.externalDocID=601923 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780335943/lc.gif&client=summon&freeimage=true |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780335943/mc.gif&client=summon&freeimage=true |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780335943/sc.gif&client=summon&freeimage=true |