Scanners for near-field microwave microscopy

• Published in: 2009 19th International Crimean Conference Microwave & Telecommunication Technology pp. 559 - 560
• Main Authors: Derkach, V.N., Golovashchenko, R.V., Goroshko, O.V., Korzh, V.G., Anbinderis, T., Laurinavicius, A.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.09.2009
• Subjects: Diffraction gratings; Helium; IEEE catalog; Microscopy; Organizing; Physics

The description of methods and facilities of microwave near-field microscopy and the radiophysical equipment designed within the framework of scientific and technical cooperation is given. The results of model experiments, amplitude and phase pictures of optically opaque objects by using the near-fi...