Estimating the cumulative downtime distribution of highly reliable components

Compound Bernoulli processes are motivated as satisfactory approximations to alternating renewal processes that model the availability of highly reliable components. The cumulative downtime distribution derived from a compound Bernoulli process is more tractable and can easily be estimated from data...

Full description

Saved in:
Bibliographic Details
Published inProceedings IEEE International Conference on Communications ICC '95 Vol. 1; pp. 177 - 181 vol.1
Main Author Jeske, D.R.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1995
Subjects
Exponential distribution
Probability distribution
Random variables
Thumb
Online AccessGet full text

Cover

Abstract Compound Bernoulli processes are motivated as satisfactory approximations to alternating renewal processes that model the availability of highly reliable components. The cumulative downtime distribution derived from a compound Bernoulli process is more tractable and can easily be estimated from data using maximum likelihood techniques. The special case of exponential repair times is examined in detail and a uniformly minimum variance unbiased estimator for the cumulative downtime distribution is derived and compared to the maximum likelihood estimator and a nonparametric estimator in terms of mean-squared error.
AbstractList Compound Bernoulli processes are motivated as satisfactory approximations to alternating renewal processes that model the availability of highly reliable components. The cumulative downtime distribution derived from a compound Bernoulli process is more tractable and can easily be estimated from data using maximum likelihood techniques. The special case of exponential repair times is examined in detail and a uniformly minimum variance unbiased estimator for the cumulative downtime distribution is derived and compared to the maximum likelihood estimator and a nonparametric estimator in terms of mean-squared error.
Author Jeske, D.R.
Author_xml – sequence: 1
  givenname: D.R.
  surname: Jeske
  fullname: Jeske, D.R.
  organization: AT&T Bell Labs., USA
BookMark eNp9Ts0OgjAYW6Im_nE28bQXEDdg_JwJRg_evBPQD5gZG9mGhrd3iZ7tpW2apl2juVQSENpR4lNKsuMlz32aZcxnAaMxmaE1SVISBlEaB0vkGfMkDhFjYZKu0LUwlveV5bLFtgN8H_tROPsC_FBv6TInuLGa16PlSmLV4I63nZiwBsGrWriO6gf3QVqzRYumEga8H2_Q_lTc8vOBA0A5aLekp_J7LPwbfgAfDz-S
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/ICC.1995.525160
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library Online
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EndPage 181 vol.1
ExternalDocumentID 525160
GroupedDBID 6IE
6IK
6IL
AAJGR
ACGHX
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
OCL
RIE
RIL
ID FETCH-ieee_primary_5251603
IEDL.DBID RIE
ISBN 0780324862
9780780324862
IngestDate Wed Jun 26 19:22:14 EDT 2024
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-ieee_primary_5251603
ParticipantIDs ieee_primary_525160
PublicationCentury 1900
PublicationDate 19950000
PublicationDateYYYYMMDD 1995-01-01
PublicationDate_xml – year: 1995
  text: 19950000
PublicationDecade 1990
PublicationTitle Proceedings IEEE International Conference on Communications ICC '95
PublicationTitleAbbrev ICC
PublicationYear 1995
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000455378
Score 2.49816
Snippet Compound Bernoulli processes are motivated as satisfactory approximations to alternating renewal processes that model the availability of highly reliable...
SourceID ieee
SourceType Publisher
StartPage 177
SubjectTerms Exponential distribution
Probability distribution
Random variables
Thumb
Title Estimating the cumulative downtime distribution of highly reliable components
URI https://ieeexplore.ieee.org/document/525160
Volume 1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV09T8MwELWgEyxAKYLyIQ-sSUNtJ84ctSpIRQwgdati-4IQVYJKUgl-PT47Ch_qwBZH0ekUx3p3l3vvCLnOcxklwOzHyzQPuDIqkLE2gRYmBo6I7NT55_fx7InfLcSi1dl2XBgAcM1nEOKl-5dvKt1gqWwkLBjHNj_fTdLUU7W6coqNTARLpEvMZWSjBBupt_o63bpV9rmJ0tFtliFPT4Te5K_RKg5Zpgeesv3uBAmxoeQ1bGoV6s8_co3_dPqQDL4pfPShA6cjsgNln-z_UB88JvOJPd4YsJbP1IaB1Fpys7w2QI3NzXHqPDWoq9uOxKJVQVHdePVB17B6Qc4VxY70qsRmjAEZTieP2SxA35ZvXsRi6d1iJ6RX2sdOCS3GWqsohwTflklTxRgbayGBKcmLiJ-R_hYDw613z8mep35jqeKC9Op1A5cWvGt15bbtC5nSm-g
link.rule.ids 310,311,783,787,792,793,799,4057,4058,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEB6kHtSLWitaX3vwmjR289ieQ0urbfFQobeQfUTEkpaaCvrrndmE-KAHb9kQhiGbZb6ZzPcNwG2aCi8yHD9ernzHl1o6IlTaUYEOjU8R2arzT6bh8Mm_nwfzSmfbcmGMMbb5zLh0af_l66XaUKmsE2AwDjE_30VYLcKSrFUXVBCbBDwSNjUXHuIExOqVwk69rrR97rxeZxTHxNQL3NLor-EqNrYMDkvS9puVJKSWkld3U0hXff4RbPyn20fQ-ibxscc6PB3DjsmbcPBDf_AEJn084ARZ82eGQJChJTvN690wjdk5zZ1nmpR1q6FYbJkx0jdefLC1WbwQ64pRT_oyp3aMFrQH_Vk8dMi3ZFXKWCSlW_wUGjk-dgYs6yolvdRE9LZ0ryc5510VCMOl8DPPP4fmFgPtrXdvYG84m4yT8Wj6cAH7JRGcCheX0CjWG3OFobyQ13YLvwDv-p8z
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Proceedings+IEEE+International+Conference+on+Communications+ICC+%2795&rft.atitle=Estimating+the+cumulative+downtime+distribution+of+highly+reliable+components&rft.au=Jeske%2C+D.R.&rft.date=1995-01-01&rft.pub=IEEE&rft.isbn=9780780324862&rft.volume=1&rft.spage=177&rft.epage=181+vol.1&rft_id=info:doi/10.1109%2FICC.1995.525160&rft.externalDocID=525160
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780324862/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780324862/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780324862/sc.gif&client=summon&freeimage=true