Evaluation of Semiconductor-Based Isolation for Electric Vehicle Chargers in DC Microgrids

• Published in: 2024 IEEE Sixth International Conference on DC Microgrids (ICDCM) pp. 1 - 6
• Main Authors: Drexler, Kilian, Gehring, Johannes, Wunder, Bernd, Zhou, Yan, Marz, Martin, Lorentz, Vincent
• Format: Conference Proceeding
• Language: English
• Published: IEEE 05.08.2024
• Subjects: Circuit faults; Circuit simulation; converter topologies; DC grid; electric vehicle chargers; Electric vehicle charging; fault behavior; ground fault; Integrated circuit modeling; Microgrids; Semiconductor device modeling; semiconductor-based isolation; simulation; Topology

In this paper, converters with semiconductor-based isolation for the application of electric vehicle (EV) charging in DC-microgrids are introduced. A PLECS circuit simulation model is set up to examine the fault behavior of those converters in comparison to standard isolated and non-isolated topolog...