Evaluation of Semiconductor-Based Isolation for Electric Vehicle Chargers in DC Microgrids

In this paper, converters with semiconductor-based isolation for the application of electric vehicle (EV) charging in DC-microgrids are introduced. A PLECS circuit simulation model is set up to examine the fault behavior of those converters in comparison to standard isolated and non-isolated topolog...

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Bibliographic Details
Published in2024 IEEE Sixth International Conference on DC Microgrids (ICDCM) pp. 1 - 6
Main Authors Drexler, Kilian, Gehring, Johannes, Wunder, Bernd, Zhou, Yan, Marz, Martin, Lorentz, Vincent
Format Conference Proceeding
LanguageEnglish
Published IEEE 05.08.2024
Subjects
Circuit faults
Circuit simulation
converter topologies
DC grid
electric vehicle chargers
Electric vehicle charging
fault behavior
ground fault
Integrated circuit modeling
Microgrids
Semiconductor device modeling
semiconductor-based isolation
simulation
Topology
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Summary:In this paper, converters with semiconductor-based isolation for the application of electric vehicle (EV) charging in DC-microgrids are introduced. A PLECS circuit simulation model is set up to examine the fault behavior of those converters in comparison to standard isolated and non-isolated topologies. Three different fault scenarios are evaluated and influence of the converter topology on the system behavior is examined. It is shown that the semiconductor-based isolating converter has a similar behavior to the standard isolating converter considering systemic faults.
DOI:10.1109/ICDCM60322.2024.10664861