Highly Accelerated Life Testing of Bi-Sb Thermocouples in Planar Multijunction Thermal Converters

This paper presents the lifetime evaluation of the bismuth (Bi) and antimony (Sb) thermocouples assisted by the copper heat shunt in a planar multijunction thermal converter (MJTC) via highly accelerated life testing (HALT). The temperature is selected as the accelerated stress variable. The electri...

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Bibliographic Details
Published in2024 Conference on Precision Electromagnetic Measurements (CPEM) pp. 1 - 2
Main Authors Amagai, Yasutaka, Okawa, Kenjiro, Sakamoto, Norihiko, Kaneko, Nobu-Hisa
Format Conference Proceeding
LanguageEnglish
Published IEEE 08.07.2024
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