First-Principles Study of Cu Addition on Mechanical Properties of Ni[sub.3]Sn[sub.4]-Based Intermetallic Compounds
Ni–Cu under-bump metallisation (UBM) can reduce stress and improve wetting ability in technology for electronic packaging technology advances with three-dimensional integrated circuit (3D IC) devices. The bond between the Sn-based solder and Ni–Cu UBM is affected by the formation of intermetallic co...
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Published in | Metals (Basel ) Vol. 14; no. 1 |
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Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
MDPI AG
01.01.2024
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Subjects | |
Online Access | Get full text |
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