First-Principles Study of Cu Addition on Mechanical Properties of Ni[sub.3]Sn[sub.4]-Based Intermetallic Compounds

Ni–Cu under-bump metallisation (UBM) can reduce stress and improve wetting ability in technology for electronic packaging technology advances with three-dimensional integrated circuit (3D IC) devices. The bond between the Sn-based solder and Ni–Cu UBM is affected by the formation of intermetallic co...

Full description

Saved in:
Bibliographic Details
Published inMetals (Basel ) Vol. 14; no. 1
Main Authors Yao, Jinye, Wang, Li, Guo, Shihao, Li, Xiaofu, Chen, Xiangxu, Shang, Min, Ma, Haoran, Ma, Haitao
Format Journal Article
LanguageEnglish
Published MDPI AG 01.01.2024
Subjects
Online AccessGet full text

Cover

Loading…