Device used for the chemical analysis of material samples and corresponding metallurgical vessel

• Main Authors: NORBERT RAMASEDER, DIETER BAEUERLE, JOHANN GRUBER, JOHANNES HEITZ
• Format: Patent
• Language: English
• Published: 12.03.2004
• Edition: 7
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

A device for the chemical analysis of solid or molten material samples, based on laser-induced emission spectroscopy, including a laser source generating a laser beam, a deflection device deflecting the laser beam, a focusing device focusing the laser beam, a device that guides the reflections of a...