Device used for the chemical analysis of material samples and corresponding metallurgical vessel

• Main Authors: NORBERT RAMASEDER, DIETER BAEUERLE, JOHANN GRUBER, JOHANNES HEITZ
• Format: Patent
• Language: English
• Published: 12.03.2004
• Edition: 7
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

A device for the chemical analysis of solid or molten material samples, based on laser-induced emission spectroscopy, including a laser source generating a laser beam, a deflection device deflecting the laser beam, a focusing device focusing the laser beam, a device that guides the reflections of a plasma ignited by the laser beam on the material sample to an evaluation device. To arrange the laser source and the evaluation device remotely from the material sample, an arm having at least one movable joint and a cavity for the laser beam is provided between the laser source and the material sample for guiding the laser beam. The deflection device is shaped as a mirror or a prism and is provided at the articulation of the arm, whereby the laser source and the evaluation device are arranged to be independent of the material sample in terms of their movements.