TESTING OPTICAL CIRCUIT AND METHOD FOR MANUFACTURING OPTICAL CIRCUIT CHIP

• Main Authors: KIKUCHI Kiyofumi, NASU Yusuke, TAKAHASHI Masayuki, IKUMA Yuichiro
• Format: Patent
• Language: English; French; Japanese
• Published: 23.03.2023
• Subjects: MEASURING; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS; OPTICS; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

Provided is a testing optical circuit which causes testing light to be, at low loss, inputted to and outputted from a circuit to be tested and with which it is possible to minimize a space when disposing the testing optical circuit. This testing optical circuit is for testing, by input and output of...