EQUIPMENT FAILURE DIAGNOSTICS USING BAYESIAN INFERENCE

• Main Authors: MEDVEDEV, Oleg O, SPRENKEL, Marcus D
• Format: Patent
• Language: English; French
• Published: 03.12.2020
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; PHYSICS

A method is described herein, comprising registering an event at a first processing unit of a processing facility comprising a plurality of processing units, using a coincidence probability array and an event probability to identify a second processing unit of the plurality of processing units based...