EQUIPMENT FAILURE DIAGNOSTICS USING BAYESIAN INFERENCE
A method is described herein, comprising registering an event at a first processing unit of a processing facility comprising a plurality of processing units, using a coincidence probability array and an event probability to identify a second processing unit of the plurality of processing units based...
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| Main Authors | , |
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| Format | Patent |
| Language | English French |
| Published |
03.12.2020
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| Subjects | |
| Online Access | Get full text |
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| Abstract | A method is described herein, comprising registering an event at a first processing unit of a processing facility comprising a plurality of processing units, using a coincidence probability array and an event probability to identify a second processing unit of the plurality of processing units based on the event, determining whether the second processing unit experienced a coincident event, if the second processing unit experienced a coincident event, remediating a condition of the second processing unit that caused the coincident event, and updating the coincidence probability array based on the event.
L'invention concerne un procédé consistant à enregistrer un événement au niveau d'une première unité de traitement d'une installation de traitement comprenant une pluralité d'unités de traitement, utiliser un réseau de probabilités de coïncidence et une probabilité d'événement pour identifier une seconde unité de traitement de la pluralité d'unités de traitement sur la base de l'événement, déterminer si la seconde unité de traitement a connu un événement coïncidant, si la seconde unité de traitement a connu un événement coïncidant, remédier à une condition de la seconde unité de traitement qui a provoqué l'événement coïncidant et mettre à jour la matrice de probabilités de coïncidence sur la base de l'événement. |
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| AbstractList | A method is described herein, comprising registering an event at a first processing unit of a processing facility comprising a plurality of processing units, using a coincidence probability array and an event probability to identify a second processing unit of the plurality of processing units based on the event, determining whether the second processing unit experienced a coincident event, if the second processing unit experienced a coincident event, remediating a condition of the second processing unit that caused the coincident event, and updating the coincidence probability array based on the event.
L'invention concerne un procédé consistant à enregistrer un événement au niveau d'une première unité de traitement d'une installation de traitement comprenant une pluralité d'unités de traitement, utiliser un réseau de probabilités de coïncidence et une probabilité d'événement pour identifier une seconde unité de traitement de la pluralité d'unités de traitement sur la base de l'événement, déterminer si la seconde unité de traitement a connu un événement coïncidant, si la seconde unité de traitement a connu un événement coïncidant, remédier à une condition de la seconde unité de traitement qui a provoqué l'événement coïncidant et mettre à jour la matrice de probabilités de coïncidence sur la base de l'événement. |
| Author | MEDVEDEV, Oleg O SPRENKEL, Marcus D |
| Author_xml | – fullname: MEDVEDEV, Oleg O – fullname: SPRENKEL, Marcus D |
| BookMark | eNrjYmDJy89L5WQwcw0M9QzwdfULUXBz9PQJDXJVcPF0dPfzDw7xdA5WCA329HNXcHKMdA32dPRT8PRzcw1y9XN25WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8eH-RgZAaGJsZGnuaGhMnCoA1R0qwg |
| ContentType | Patent |
| DBID | EVB |
| DatabaseName | esp@cenet |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Medicine Chemistry Sciences Physics |
| DocumentTitleAlternate | DIAGNOSTIC DE DÉFAILLANCE D'ÉQUIPEMENT À L'AIDE D'UNE INFÉRENCE BAYÉSIENNE |
| ExternalDocumentID | WO2020243297A1 |
| GroupedDBID | EVB |
| ID | FETCH-epo_espacenet_WO2020243297A13 |
| IEDL.DBID | EVB |
| IngestDate | Fri Jul 19 13:13:16 EDT 2024 |
| IsOpenAccess | true |
| IsPeerReviewed | false |
| IsScholarly | false |
| Language | English French |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-epo_espacenet_WO2020243297A13 |
| Notes | Application Number: WO2020US34915 |
| OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201203&DB=EPODOC&CC=WO&NR=2020243297A1 |
| ParticipantIDs | epo_espacenet_WO2020243297A1 |
| PublicationCentury | 2000 |
| PublicationDate | 20201203 |
| PublicationDateYYYYMMDD | 2020-12-03 |
| PublicationDate_xml | – month: 12 year: 2020 text: 20201203 day: 03 |
| PublicationDecade | 2020 |
| PublicationYear | 2020 |
| RelatedCompanies | SERVICES PETROLIERS SCHLUMBERGER SCHLUMBERGER TECHNOLOGY CORPORATION SCHLUMBERGER TECHNOLOGY B.V SCHLUMBERGER CANADA LIMITED |
| RelatedCompanies_xml | – name: SCHLUMBERGER TECHNOLOGY B.V – name: SCHLUMBERGER CANADA LIMITED – name: SCHLUMBERGER TECHNOLOGY CORPORATION – name: SERVICES PETROLIERS SCHLUMBERGER |
| Score | 3.3005261 |
| Snippet | A method is described herein, comprising registering an event at a first processing unit of a processing facility comprising a plurality of processing units,... |
| SourceID | epo |
| SourceType | Open Access Repository |
| SubjectTerms | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING PHYSICS |
| Title | EQUIPMENT FAILURE DIAGNOSTICS USING BAYESIAN INFERENCE |
| URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201203&DB=EPODOC&locale=&CC=WO&NR=2020243297A1 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1ZS8NAEB5KPd80Kh5VAkregjk2Rx-K5Ni0EZvUtNH2qeQEQdJiIv59d5dU-9THnYFhdmF29pudA-AhQ2pO3JIsmko_F5FZpiKBQamY0tbomZZIBeszOw70UYye59q8A5-bWhjWJ_SHNUckFpURe2_Yfb3-D2K5LLeyfkw_CGn15M0GrtCiY4WWgqqCaw_wJHRDR3AcgtuEIGI8BalK37AIVtojD2mD2gN-s2ldynrbqXgnsD8h8qrmFDpFxcGRs5m9xsHhuP3y5uCA5WhmNSG2dlifgY5fY59NzuQ9y3-JI8y7vjUMwunMd6Y8naUx5G1rgae-FfB-4OGIhpLO4d7DM2ckElWWfztfvofbeqsX0K1WVXEJvKYbEpJLXcuNBCE1NU1ZKxJdymQKkOTyCnq7JF3vZt_AMV2yrA21B93m67u4Jb63Se_Ykf0CzOmAaw |
| link.rule.ids | 230,309,783,888,25576,76876 |
| linkProvider | European Patent Office |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8Q_MA3nRo_UJdo9rbItu6DB2LG1kEVOoQh-LSwMRITM4jM-O_bNkN54rWXXK5Nrtff9e53AA8pMuYsLGmqozfnKnIWicpgUKImnBo9NWeNTPDM9qnVHaPnqTmtwOemF0bwhP4IckTmUSnz90Lc16v_JJYvaivXj8kHW1o-BVHLV0p0rPNWUEPx2y08CP3QUzyP4TaFDoVMR4betF2GlfbYI9vm_oDf2rwvZbUdVIJj2B8wfXlxApUsl6DmbWavSXDYL7-8JTgQNZrpmi2Wfrg-BQu_jomYnCkHLumNh1j2iduh4Sgi3kjmszQ6ctt9xyPiUpnQAA95KukM7gMceV2VmRL_7TyehNt2G-dQzZd5dgGyadkNpC0sc27PEDISx9HMbGY1Uo0DJG1xCfVdmq52i--g1o36vbhH6Ms1HHGRqOAw6lAtvr6zGxaHi-RWHN8v_uiDXg |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=EQUIPMENT+FAILURE+DIAGNOSTICS+USING+BAYESIAN+INFERENCE&rft.inventor=MEDVEDEV%2C+Oleg+O&rft.inventor=SPRENKEL%2C+Marcus+D&rft.date=2020-12-03&rft.externalDBID=A1&rft.externalDocID=WO2020243297A1 |