SCRATCH IDENTIFICATION UTILIZING INTEGRATED DEFECT MAPS

In one example of the disclosure, a set of scanned images is accessed. The scanned images are scans of distinct printouts of subject images produced utilizing a photo imaging plate. A set of defect maps is created by comparing the scanned images to reference data for the subject images. The set of d...

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Main Authors HAIK, Oren, PERRY, Oded, MALKI, Avi
Format Patent
LanguageEnglish
French
Published 27.09.2018
Subjects
CINEMATOGRAPHY
ELECTROGRAPHY
ELECTROPHOTOGRAPHY
HOLOGRAPHY
MAGNETOGRAPHY
PHOTOGRAPHY
PHYSICS
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Abstract In one example of the disclosure, a set of scanned images is accessed. The scanned images are scans of distinct printouts of subject images produced utilizing a photo imaging plate. A set of defect maps is created by comparing the scanned images to reference data for the subject images. The set of defect maps are combined into an integrated defect map. A scratch defect on the PIP is identified utilizing the integrated defect map. Dans un exemple de l'invention, on accède à un ensemble d'images balayées. Les images balayées sont des balayages d'imprimés distincts d'images de sujet produites à l'aide d'une plaque d'imagerie photographique. Un ensemble de cartes de défauts est créé en comparant les images balayées aux données de référence des images de sujet. L'ensemble de cartes de défauts est combiné en une carte de défauts intégrée. Un défaut de rayure sur l'image PIP est identifié à l'aide de la carte de défauts intégrée.
AbstractList In one example of the disclosure, a set of scanned images is accessed. The scanned images are scans of distinct printouts of subject images produced utilizing a photo imaging plate. A set of defect maps is created by comparing the scanned images to reference data for the subject images. The set of defect maps are combined into an integrated defect map. A scratch defect on the PIP is identified utilizing the integrated defect map. Dans un exemple de l'invention, on accède à un ensemble d'images balayées. Les images balayées sont des balayages d'imprimés distincts d'images de sujet produites à l'aide d'une plaque d'imagerie photographique. Un ensemble de cartes de défauts est créé en comparant les images balayées aux données de référence des images de sujet. L'ensemble de cartes de défauts est combiné en une carte de défauts intégrée. Un défaut de rayure sur l'image PIP est identifié à l'aide de la carte de défauts intégrée.
Author HAIK, Oren
PERRY, Oded
MALKI, Avi
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DocumentTitleAlternate IDENTIFICATION DE RAYURES UTILISANT DES CARTES DE DÉFAUTS INTÉGRÉES
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SubjectTerms CINEMATOGRAPHY
ELECTROGRAPHY
ELECTROPHOTOGRAPHY
HOLOGRAPHY
MAGNETOGRAPHY
PHOTOGRAPHY
PHYSICS
Title SCRATCH IDENTIFICATION UTILIZING INTEGRATED DEFECT MAPS
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