INLINE X-RAY INSPECTION SYSTEM AND IMAGING METHOD FOR INLINE X-RAY INSPECTION SYSTEM

The purpose of the present invention is to prevent the degradation of internal defect detection accuracy resulting from increased scattered ray component generation between detection elements when a planar detector in which detection elements are densely arranged in two dimensions is used for the pu...

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Bibliographic Details
Main Author SADAOKA Noriyuki
Format Patent
LanguageEnglish
French
Japanese
Published 24.05.2018
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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