CONTACT CONDUCTION JIG AND INSPECTION DEVICE

[Problem] To provide a contact conduction jig and an inspection device which easily improve the ability to absorb variations in height of an object to be in contact with. [Solution] An inspection jig 3 is provided with: a support plate 31 that is a plate-like member and has formed therein a pluralit...

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Bibliographic Details
Main Author NUMATA Kiyoshi
Format Patent
LanguageEnglish
French
Japanese
Published 07.12.2017
Subjects
BASIC ELECTRIC ELEMENTS
CURRENT COLLECTORS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
LINE CONNECTORS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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