METHOD AND APPARATUS OF USING A SCANNING PROBE MICROSCOPE

a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope...

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Bibliographic Details
Main Authors ADAMS, Jonathan David, NIEVERGELT, Adrian Pascal, FANTNER, Georg Ernest
Format Patent
LanguageEnglish
French
Published 17.11.2016
Subjects
APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
MEASURING
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
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Summary:a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope, the means for modulating being adapted to provide a direct cantilever actuation. L'invention concerne un microscope-sonde à balayage pour imagerie à haute vitesse et/ou cartographie nanomécanique. Le microscope comprend une sonde de balayage comprenant un porte-à-faux doté d'une pointe à l'extrémité distale; et des moyens pour moduler une distance pointe-échantillon séparant la pointe d'un échantillon destiné à être vu avec le microscope, les moyens de modulation étant aptes à fournir un actionnement en porte à faux direct.
Bibliography:Application Number: WO2016IB52701