SEMICONDUCTOR DEVICE

The present invention is a semiconductor device that has achieved small size, high withstand voltage properties and high reliability. The present invention comprises: an electrical field alleviation layer (13) that surrounds an active region on the surface of a semiconductor substrate (11); an insul...

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Bibliographic Details
Main Authors KAWAKAMI TSUYOSHI, MASUOKA FUMIHITO, NISHII AKITO, NAKAMURA KATSUMI, CHEN ZE
Format Patent
LanguageEnglish
French
Japanese
Published 16.07.2015
Subjects
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