ETCHANT COMPOSITION AND METHOD FOR FORMING METAL WIRE AND THIN FILM TRANSISTOR SUBSTRATE USING SAME
An etchant composition according to an embodiment of the present invention comprises: based on the total weight of the etchant composition, 0.5 wt% to 20 wt% of persulfate, 0.01 wt% to 1 wt% of a fluorine compound, 1 wt% to about 10 wt% of an inorganic acid, 0.01 wt% to 2 wt% of an azole-based compo...
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Format | Patent |
Language | English French Korean |
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02.04.2015
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Abstract | An etchant composition according to an embodiment of the present invention comprises: based on the total weight of the etchant composition, 0.5 wt% to 20 wt% of persulfate, 0.01 wt% to 1 wt% of a fluorine compound, 1 wt% to about 10 wt% of an inorganic acid, 0.01 wt% to 2 wt% of an azole-based compound, 0.1 wt% to 5 wt% of a chlorine compound, 0.05 wt% to 3 wt% of copper salt, 0.01 wt% to 5 wt% of a sulfating agent or a salt of the sulfating agent, and water of which the weight is such that the total weight of the entire composition reaches 100 wt%. The etchant composition can be used to form a metal wire or manufacture a thin film transistor substrate by etching a metal film containing copper.
La présente invention concerne, selon un mode de réalisation, une composition d'agent de gravure qui comprend : sur la base du poids total de la composition d'agent de gravure, entre 0,5 % en poids et 20 % en poids de persulfate, entre 0,01 % en poids et 1 % en poids d'un composé fluoré, entre 1 % en poids et environ 10 % en poids d'un acide inorganique, entre 0,01 % en poids et 2 % en poids d'un composé à base d'azole, entre 0,1 % en poids et 5 % en poids d'un composé chloré, entre 0,05 % en poids et 3 % en poids d'un sel de cuivre, entre 0,01 % en poids et 5 % en poids d'un agent de sulfatation ou d'un sel de l'agent de sulfatation, et de l'eau dont le poids est tel que le poids total de toute la composition atteint 100 % en poids. La composition d'agent de gravure peut être utilisée pour former un fil métallique ou fabriquer un substrat de transistor à couches minces par gravure d'un film métallique contenant du cuivre.
본 발명의 일 실시예에 따른 식각액 조성물은 식각액 조성물 총 중량에 대하여 0.5중량% 내지 20중량%의 과황산염, 0.01중량% 내지 1중량%의 불소 화합물, 1중량% 내지 약 10중량%의 무기산, 0.01중량% 내지 2중량%의 아졸계 화합물, 0.1중량% 내지 5중량%의 염소 화합물, 0.05중량% 내지 3중량%의 구리염, 0.01중량% 내지 5중량%의 항산화제 또는 상기 항산화제의 염, 및 전체 조성물의 총 중량이 100중량%가 되도록 하는 물을 포함한다. 식각액 조성물은 구리를 포함하는 금속막을 식각하여 금속 배선을 형성하거나 표시 장치용 박막 트랜지스터 기판 제조시에 사용될 수 있다. |
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AbstractList | An etchant composition according to an embodiment of the present invention comprises: based on the total weight of the etchant composition, 0.5 wt% to 20 wt% of persulfate, 0.01 wt% to 1 wt% of a fluorine compound, 1 wt% to about 10 wt% of an inorganic acid, 0.01 wt% to 2 wt% of an azole-based compound, 0.1 wt% to 5 wt% of a chlorine compound, 0.05 wt% to 3 wt% of copper salt, 0.01 wt% to 5 wt% of a sulfating agent or a salt of the sulfating agent, and water of which the weight is such that the total weight of the entire composition reaches 100 wt%. The etchant composition can be used to form a metal wire or manufacture a thin film transistor substrate by etching a metal film containing copper.
La présente invention concerne, selon un mode de réalisation, une composition d'agent de gravure qui comprend : sur la base du poids total de la composition d'agent de gravure, entre 0,5 % en poids et 20 % en poids de persulfate, entre 0,01 % en poids et 1 % en poids d'un composé fluoré, entre 1 % en poids et environ 10 % en poids d'un acide inorganique, entre 0,01 % en poids et 2 % en poids d'un composé à base d'azole, entre 0,1 % en poids et 5 % en poids d'un composé chloré, entre 0,05 % en poids et 3 % en poids d'un sel de cuivre, entre 0,01 % en poids et 5 % en poids d'un agent de sulfatation ou d'un sel de l'agent de sulfatation, et de l'eau dont le poids est tel que le poids total de toute la composition atteint 100 % en poids. La composition d'agent de gravure peut être utilisée pour former un fil métallique ou fabriquer un substrat de transistor à couches minces par gravure d'un film métallique contenant du cuivre.
본 발명의 일 실시예에 따른 식각액 조성물은 식각액 조성물 총 중량에 대하여 0.5중량% 내지 20중량%의 과황산염, 0.01중량% 내지 1중량%의 불소 화합물, 1중량% 내지 약 10중량%의 무기산, 0.01중량% 내지 2중량%의 아졸계 화합물, 0.1중량% 내지 5중량%의 염소 화합물, 0.05중량% 내지 3중량%의 구리염, 0.01중량% 내지 5중량%의 항산화제 또는 상기 항산화제의 염, 및 전체 조성물의 총 중량이 100중량%가 되도록 하는 물을 포함한다. 식각액 조성물은 구리를 포함하는 금속막을 식각하여 금속 배선을 형성하거나 표시 장치용 박막 트랜지스터 기판 제조시에 사용될 수 있다. |
Author | MOON, YOUNGMIN CHOUNG, JONG-HYUN LEE, KI-BEOM KIM, IN-BAE SEO, WON-GUK SHIN, HYUNOL CHO, SAM-YOUNG KIM, GYU-PO HAN, SEUNG-YEON PARK, HONGSICK |
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DocumentTitleAlternate | COMPOSITION D'AGENT DE GRAVURE ET PROCÉDÉ PERMETTANT DE FORMER UN FIL MÉTALLIQUE ET UN SUBSTRAT DE TRANSISTOR À COUCHES MINCES À L'AIDE DE CETTE DERNIÈRE 식각액 조성물, 및 이를 이용한 금속 배선과 박막 트랜지스터 기판 형성 방법 |
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Snippet | An etchant composition according to an embodiment of the present invention comprises: based on the total weight of the etchant composition, 0.5 wt% to 20 wt%... |
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SubjectTerms | CHEMICAL SURFACE TREATMENT CHEMISTRY COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING MATERIAL WITH METALLIC MATERIAL COATING METALLIC MATERIAL DIFFUSION TREATMENT OF METALLIC MATERIAL INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL METALLURGY MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLICMATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASSC23 AND AT LEAST ONEPROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25 NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE |
Title | ETCHANT COMPOSITION AND METHOD FOR FORMING METAL WIRE AND THIN FILM TRANSISTOR SUBSTRATE USING SAME |
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