AN INTEGRATED CIRCUIT INCLUDING A PROGRAMMABLE LOGIC ANALYZER WITH ENHANCED ANALYZING AND DEBUGGING CAPABILITIES AND A METHOD THEREFOR

• Main Authors: BAILEY, JAMES, RAY, WARD, JAMES, ALAN
• Format: Patent
• Language: English; French
• Published: 24.02.2011
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor In one embodiment, an embedded logic analyzer (ELA) receives a plurality of signals from a plurality of buses within an integrated circuit The ELA includes an interconnect module...