POSITIVE RESIST COMPOSITION FOR FORMING THICK RESIST FILM, OBJECT COATED WITH THICK RESIST, AND METHOD OF FORMING RESIST PATTERN

A positive resist composition which is for forming a thick resist film having a thickness of 1-15 µm. The positive resist composition comprises: a resin ingredient (A) comprising a polymer (A1) having a mass-average molecular weight of 20,000-50,000 and having a structural unit (a1) derived from hyd...

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Main Authors SHIMBORI, HIROSHI, YAMAGUCHI, TOSHIHIRO, MASUJIMA, MASAHIRO, YOSHIZAWA, SACHIKO
Format Patent
LanguageEnglish
French
Japanese
Published 09.08.2007
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Abstract A positive resist composition which is for forming a thick resist film having a thickness of 1-15 µm. The positive resist composition comprises: a resin ingredient (A) comprising a polymer (A1) having a mass-average molecular weight of 20,000-50,000 and having a structural unit (a1) derived from hydroxystyrene and a structural unit (a2) containing an acid-dissociable dissolution-inhibitive group and derived from an acrylic ester; an acid generator ingredient (B) which comprises an onium salt type acid generator having an anionic part represented by the general formula (I): R4"SO3 L'invention concerne une composition de resist positif destinée à la formation d'un film de resist épais ayant une épaisseur comprise entre 1 et 15 µm. La composition de resist positif comprend : un ingrédient de résine (A) comprenant un polymère (A1) ayant une masse moléculaire moyenne en masse comprise entre 20 000 et 50 000 et ayant une unité structurale (a1) dérivée d'hydroxystyrène et une unité structurale (a2) contenant un groupement inhibiteur de dissolution dissociable en milieu acide et dérivée d'un ester acrylique ; un ingrédient générateur d'acide (B) comprenant un générateur d'acide de type sel d'onium ayant une partie anionique représentée par la formule générale (I) : R4'SO3
AbstractList A positive resist composition which is for forming a thick resist film having a thickness of 1-15 µm. The positive resist composition comprises: a resin ingredient (A) comprising a polymer (A1) having a mass-average molecular weight of 20,000-50,000 and having a structural unit (a1) derived from hydroxystyrene and a structural unit (a2) containing an acid-dissociable dissolution-inhibitive group and derived from an acrylic ester; an acid generator ingredient (B) which comprises an onium salt type acid generator having an anionic part represented by the general formula (I): R4"SO3 L'invention concerne une composition de resist positif destinée à la formation d'un film de resist épais ayant une épaisseur comprise entre 1 et 15 µm. La composition de resist positif comprend : un ingrédient de résine (A) comprenant un polymère (A1) ayant une masse moléculaire moyenne en masse comprise entre 20 000 et 50 000 et ayant une unité structurale (a1) dérivée d'hydroxystyrène et une unité structurale (a2) contenant un groupement inhibiteur de dissolution dissociable en milieu acide et dérivée d'un ester acrylique ; un ingrédient générateur d'acide (B) comprenant un générateur d'acide de type sel d'onium ayant une partie anionique représentée par la formule générale (I) : R4'SO3
Author YOSHIZAWA, SACHIKO
SHIMBORI, HIROSHI
YAMAGUCHI, TOSHIHIRO
MASUJIMA, MASAHIRO
Author_xml – fullname: SHIMBORI, HIROSHI
– fullname: YAMAGUCHI, TOSHIHIRO
– fullname: MASUJIMA, MASAHIRO
– fullname: YOSHIZAWA, SACHIKO
BookMark eNrjYmDJy89L5WRoCPAP9gzxDHNVCHIN9gwOUXD294UI-fspuPkHgbCvp5-7QoiHp7M3TJGbp4-vjoK_k5erM0iHY4iri0K4Z4gHiiodBUc_FwVf1xAPfxcFfze4SVAzAhxDQlyD_HgYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSXy4v5GBgbmBBRCYOBoaE6cKAANmPvk
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate COMPOSITION DE RESIST POSITIF POUR LA FORMATION D'UN FILM EPAIS DE RESIST, OBJET ENDUIT D'UN RESIST EPAIS ET PROCEDE DE FORMATION D'UN MOTIF DE RESIST
ExternalDocumentID WO2007088884A1
GroupedDBID EVB
ID FETCH-epo_espacenet_WO2007088884A13
IEDL.DBID EVB
IngestDate Fri Jul 19 15:28:39 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
French
Japanese
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_WO2007088884A13
Notes Application Number: WO2007JP51589
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070809&DB=EPODOC&CC=WO&NR=2007088884A1
ParticipantIDs epo_espacenet_WO2007088884A1
PublicationCentury 2000
PublicationDate 20070809
PublicationDateYYYYMMDD 2007-08-09
PublicationDate_xml – month: 08
  year: 2007
  text: 20070809
  day: 09
PublicationDecade 2000
PublicationYear 2007
RelatedCompanies YOSHIZAWA, SACHIKO
SHIMBORI, HIROSHI
YAMAGUCHI, TOSHIHIRO
TOKYO OHKA KOGYO CO., LTD
MASUJIMA, MASAHIRO
RelatedCompanies_xml – name: TOKYO OHKA KOGYO CO., LTD
– name: YOSHIZAWA, SACHIKO
– name: SHIMBORI, HIROSHI
– name: YAMAGUCHI, TOSHIHIRO
– name: MASUJIMA, MASAHIRO
Score 2.783636
Snippet A positive resist composition which is for forming a thick resist film having a thickness of 1-15 µm. The positive resist composition comprises: a resin...
SourceID epo
SourceType Open Access Repository
SubjectTerms APPARATUS SPECIALLY ADAPTED THEREFOR
BASIC ELECTRIC ELEMENTS
CINEMATOGRAPHY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
SEMICONDUCTOR DEVICES
Title POSITIVE RESIST COMPOSITION FOR FORMING THICK RESIST FILM, OBJECT COATED WITH THICK RESIST, AND METHOD OF FORMING RESIST PATTERN
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070809&DB=EPODOC&locale=&CC=WO&NR=2007088884A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR1dS8Mw8Bjz802n4seUgNKnFaXN2u1hSNcPW7VNcXHb22jTDhTZhqv46k_32q1zviyQl7vkIAeXy13uA-CGohoRWpzKTXEXyVQRQm6nqiJrce5N1hOhtPMEZz_Q3Ff6OGwOK_BR5sIUdUK_i-KIKFEC5T0r7uvZnxPLKmIr57fxG4Km9w7vWFJpHev4AGpLVrdjh8xipmSaaLdJwcsSh4MaaCtt4UNaz-XB7nfzvJTZulJxDmA7RHqT7BAq71EN9syy91oNdv3ll3cNdooYTTFH4FIO50fwE7Kex72-TZCBXo8Tk_kLEAsI2nX59L3ggXDXM5_KRY737DcIKzqc4A4DLy0y8Lj7b1WDGIFFfJu7zCLMWVFa0ggNntfQPYZrx-amK-OhRisejgZsnQPqCVQn00l6CmQsRJLEqapqekKpErVaYyVKopSmTU0oVD-D-iZK55vRF7C_cIbmMRZ1qGafX-klavEsviqY_wswKpa3
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR1dT8IwsCH4gW-KGj9Qm2j2xKLZygYPxIx9uApbF6nAG9m6kWgMEMH46k_3NjbEF5r05a69pNdcr3e9uyJ0R0CNCC1K5IZ4CGWiCCG3ElWRtSj1JuuxUFppgrPna-4reR41RiX0UeTCZHVCv7PiiCBRAuR9mZ3X8z8nlpXFVi7uozcAzR4d3rakwjrW4QLUkqxO2w6YxUzJNMFuk_yXHAeNGGAr7cAlW0_lwR500ryU-aZScQ7RbgD0pssjVHoPq6hiFn-vVdG-lz95V9FeFqMpFgDM5XBxjH4C1qecDmwMDKR9jk3mrUDMx2DXpd2j_hPmLjW7xSCH9rw6ZtkPJzDDgEMLDyl3_42qY8O3sGdzl1mYOWtKOY3A4GkN3RN069jcdGVY1HjNw_GQbXJAPUXl6WyanCE8ESKOo0RVNT0mRAmbzYkSxmFCkoYmFKKfo9o2Shfb0Teo4nKvN-5Rv3uJDlaO0TTeoobKy8-v5Ao0-jK6zjbiF2-imao
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=POSITIVE+RESIST+COMPOSITION+FOR+FORMING+THICK+RESIST+FILM%2C+OBJECT+COATED+WITH+THICK+RESIST%2C+AND+METHOD+OF+FORMING+RESIST+PATTERN&rft.inventor=SHIMBORI%2C+HIROSHI&rft.inventor=YAMAGUCHI%2C+TOSHIHIRO&rft.inventor=MASUJIMA%2C+MASAHIRO&rft.inventor=YOSHIZAWA%2C+SACHIKO&rft.date=2007-08-09&rft.externalDBID=A1&rft.externalDocID=WO2007088884A1