TEST SYSTEM AND METHODOLOGY

• Main Authors: SAUK, FRANK, M, WELLS, GARY, A, HO, THOMAS, P
• Format: Patent
• Language: English; French
• Published: 22.01.2004
• Edition: 7
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; SEMICONDUCTOR DEVICES; TESTING

A test system for testing an electronic device is deployable in two basic configurations. In one of the configurations, a load board (62) that receives a unit (60) of the device is directly attached to a test head (16). In the other configuration, the same load board or one having largely the same p...