STACKABLE SEMICONDUCTOR TEST SYSTEM AND METHOD FOR OPERATING SAME

A tester configured to stack with at least one other tester (102)f to provide a test system for simultaneously testing a number of devices in parallel on different testers (102), or testing a device having more pins than can be accommodated by a single tester (102). The tester (102) includes a test...

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Bibliographic Details
Main Authors WAKEFIELD, RAY, TRUDEAU, PAUL, G, MAGLIOCCO, PAUL
Format Patent
LanguageEnglish
French
Published 18.12.2003
Edition7
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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