Testing a non-core MMU

• Main Authors: Schumann John A, Lecocq Paul F, Dusanapudi Manoj, Kapoor Shakti
• Format: Patent
• Language: English
• Published: 20.03.2018
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

Embodiments herein provide a testing apparatus (whether physical or simulated) for testing a non-core MMU in a processor chip. Unlike core MMUs, non-core MMUs may be located in a part of the processor chip outside of the processing cores in the chip. Instead of being used to perform address translat...