Edge crack detection system
According to an exemplary embodiment, a method of detecting edge cracks in a die under test is provided. The method includes the following operations: receiving a command signal; providing power from the command signal; providing a response signal based on the command signal; and self-destructing ba...
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| Main Authors | , , , , , |
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| Format | Patent |
| Language | English |
| Published |
30.01.2018
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| Subjects | |
| Online Access | Get full text |
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| Abstract | According to an exemplary embodiment, a method of detecting edge cracks in a die under test is provided. The method includes the following operations: receiving a command signal; providing power from the command signal; providing a response signal based on the command signal; and self-destructing based on the command signal. |
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| AbstractList | According to an exemplary embodiment, a method of detecting edge cracks in a die under test is provided. The method includes the following operations: receiving a command signal; providing power from the command signal; providing a response signal based on the command signal; and self-destructing based on the command signal. |
| Author | Tsai Cheng-Hung Hsiao Huang-Ting Tsao Pei-Haw Chen Tsui-Mei Xu An-Tai Lu Nai-Cheng |
| Author_xml | – fullname: Chen Tsui-Mei – fullname: Xu An-Tai – fullname: Tsai Cheng-Hung – fullname: Lu Nai-Cheng – fullname: Hsiao Huang-Ting – fullname: Tsao Pei-Haw |
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| Notes | Application Number: US201615244142 |
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| RelatedCompanies | Taiwan Semiconductor Manufacturing Company Limited TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD |
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| Snippet | According to an exemplary embodiment, a method of detecting edge cracks in a die under test is provided. The method includes the following operations:... |
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| SubjectTerms | BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY HANDLING RECORD CARRIERS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS SEMICONDUCTOR DEVICES TESTING |
| Title | Edge crack detection system |
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