Enabling testing of production systems without affecting customer data sets system and method

• Main Authors: Elliott Adam, Nigul Leho, Amigud Eugene, Ananthanarayanan Bhuvan, Muralidhar Krishnamurthy, Siotia Sanjeev
• Format: Patent
• Language: English
• Published: 05.12.2017
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

A method, computer program product, and computer system for matching, at a computing device, one or more parameters of test data to one or more rules. A location of a data store is selected to store results of the test data, wherein the location is selected based upon, at least in part, the one or m...