Enabling testing of production systems without affecting customer data sets system and method

A method, computer program product, and computer system for matching, at a computing device, one or more parameters of test data to one or more rules. A location of a data store is selected to store results of the test data, wherein the location is selected based upon, at least in part, the one or m...

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Main Authors Elliott Adam, Nigul Leho, Amigud Eugene, Ananthanarayanan Bhuvan, Muralidhar Krishnamurthy, Siotia Sanjeev
Format Patent
LanguageEnglish
Published 05.12.2017
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Abstract A method, computer program product, and computer system for matching, at a computing device, one or more parameters of test data to one or more rules. A location of a data store is selected to store results of the test data, wherein the location is selected based upon, at least in part, the one or more rules matched to the one or more parameters of the test data. The results of the test data is separated from results of production data by storing the results of the test data at the location of the data store selected based upon, at least in part, the one or more rules matched to the one or more parameters of the test data.
AbstractList A method, computer program product, and computer system for matching, at a computing device, one or more parameters of test data to one or more rules. A location of a data store is selected to store results of the test data, wherein the location is selected based upon, at least in part, the one or more rules matched to the one or more parameters of the test data. The results of the test data is separated from results of production data by storing the results of the test data at the location of the data store selected based upon, at least in part, the one or more rules matched to the one or more parameters of the test data.
Author Muralidhar Krishnamurthy
Siotia Sanjeev
Ananthanarayanan Bhuvan
Elliott Adam
Amigud Eugene
Nigul Leho
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Snippet A method, computer program product, and computer system for matching, at a computing device, one or more parameters of test data to one or more rules. A...
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SubjectTerms CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
Title Enabling testing of production systems without affecting customer data sets system and method
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