Door latch interruption upon detection of current leakage

Appliances that include a ground fault door latch trip circuit that leverages a door latch circuit of the appliance to open one or more component relays upon detection of a current leakage event are provided. In particular, the ground fault door latch trip circuit can provide one or more shunt paths...

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Bibliographic Details
Main Authors Reder Andrew Leroy, Ranasinghe Sajeev Lathika, Kaiser Timothy David
Format Patent
LanguageEnglish
Published 22.08.2017
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Summary:Appliances that include a ground fault door latch trip circuit that leverages a door latch circuit of the appliance to open one or more component relays upon detection of a current leakage event are provided. In particular, the ground fault door latch trip circuit can provide one or more shunt paths when a ground fault event is detected. The shunt paths can shunt current from a door latch to ground, such that the door latch circuit operates as if the door of the appliance has been opened.
Bibliography:Application Number: US201414165662