X-ray backscatter system and method for detecting discrepancies in items
A method for detecting discrepancies in an item is provided. The method comprises: directing energy waves at the item along at least one dimension, wherein a portion of the energy waves are reflected back from the item; detecting reflected energy waves from the item along at least one dimension and...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
18.07.2017
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Subjects | |
Online Access | Get full text |
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Summary: | A method for detecting discrepancies in an item is provided. The method comprises: directing energy waves at the item along at least one dimension, wherein a portion of the energy waves are reflected back from the item; detecting reflected energy waves from the item along at least one dimension and recording the intensity of the detected reflected energy waves, and forming a one-dimensional image of the item from the detected reflected energy waves. |
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Bibliography: | Application Number: US201213437459 |