Multilayer mirror, method of producing a multilayer mirror and lithographic apparatus

A multilayer mirror for use in device lithography is configured to reflect and/or pattern radiation having a wavelength in the range of about 6.4 nm to about 7.2 nm. The multilayer mirror has a plurality of alternating layers of materials. The plurality of alternating layers of materials include fir...

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Bibliographic Details
Main Authors Glushkov Denis Alexandrovich, Salashchenko Nikolay Nikolaevitch, Sjmaenok Leonid Aizikovitch, Polkovnikov Vladimir Nikolaevich, Yakunin Andrei Mikhailovich
Format Patent
LanguageEnglish
Published 20.09.2016
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