Circuit tracing using a focused ion beam
Methods and systems for tracing circuitry on integrated circuits using focused ion beam based imaging techniques. A first component or node on an integrated circuit is coupled to a second component or node on the same integrated circuit. After an external bias is applied to the first component or no...
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Main Authors | , , , , |
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Format | Patent |
Language | English |
Published |
05.07.2016
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Subjects | |
Online Access | Get full text |
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