Clear mottle analyzer for multilayer laminates

This disclosure relates to systems, devices and methods utilized to quantitatively measure the level of mottle in multilayer laminates. The systems and method are generally free of the inconsistencies, variability and inherent biases of the traditional subjective process by which a person of ordinar...

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Bibliographic Details
Main Author HURLBUT JEFFREY B
Format Patent
LanguageEnglish
Published 12.04.2016
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
TESTING
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Summary:This disclosure relates to systems, devices and methods utilized to quantitatively measure the level of mottle in multilayer laminates. The systems and method are generally free of the inconsistencies, variability and inherent biases of the traditional subjective process by which a person of ordinary skill in the art can assess and categorize the mottle of a multilayer laminate. In the method, variations in the images of mottle produced by a shadowgraph are quantified, measured and classified.
Bibliography:Application Number: US201113306233