Methods of manufacturing a magnetoresistive random access memory device

In a method of manufacturing an MRAM device, a first sacrificial layer, an etch stop layer, and a second sacrificial layer are sequentially formed on a substrate and then partially etched to form openings therethrough. Lower electrodes are formed to fill the openings. The first and second sacrificia...

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Bibliographic Details
Main Authors PARK JONGUL, KWON HYUNG-JOON, NOH EUN-SUN, KWON SHIN, YOON HYE-JI, KIM CHAE-LYOUNG
Format Patent
LanguageEnglish
Published 05.04.2016
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