Low voltage metal gate antifuse with depletion mode MOSFET

An antifuse according to an embodiment of the invention herein can include a depletion mode metal oxide semiconductor field effect transistor ("MOSFET") having a conduction channel and a metal gate overlying the conduction channel. A cathode and an anode of the antifuse can be electrically...

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Bibliographic Details
Main Author LI YAN-ZUN
Format Patent
LanguageEnglish
Published 16.06.2015
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INFORMATION STORAGE
PHYSICS
SEMICONDUCTOR DEVICES
STATIC STORES
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Summary:An antifuse according to an embodiment of the invention herein can include a depletion mode metal oxide semiconductor field effect transistor ("MOSFET") having a conduction channel and a metal gate overlying the conduction channel. A cathode and an anode of the antifuse can be electrically coupled to the gate, such that the antifuse is programmable by driving a programming current between the cathode and the anode to cause material of the metal gate to migrate away. Under appropriate biasing conditions, when the antifuse is unprogrammed, the conduction channel is turned on unless a voltage above a first threshold voltage is applied to the gate to turn off the conduction channel. The gate can be configured such that when the antifuse has been programmed, the conduction channel remains turned on even if a voltage above the first threshold voltage is applied between the gate and a source region of the MOSFET.
Bibliography:Application Number: US201414449180