Electronic apparatus

• Main Authors: IBE HIDEFUMI, TOBA TADANOBU, TANIGUCHI HITOSHI, SHIMBO KENICHI
• Format: Patent
• Language: English
• Published: 02.12.2014
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A failure caused by a soft-error including MNU, of an electronic apparatus is prevented, while suppressing increase of a mounting area, power consumption, and processing time. The electronic apparatus stores data indicating the state of a flip-flop included in a sequential logic circuit within an ar...