Method of testing an integrity of a material layer in a semiconductor structure

A method comprises providing a semiconductor structure. The semiconductor structure comprises a feature comprising a first material and a layer of a second material formed over the feature. The semiconductor structure is exposed to an etchant. The etchant is adapted to selectively remove the first m...

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Main Authors KOSCHINSKY FRANK, LANGER ECKHARD, MEYER MORITZ ANDREAS
Format Patent
LanguageEnglish
Published 15.11.2011
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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Abstract A method comprises providing a semiconductor structure. The semiconductor structure comprises a feature comprising a first material and a layer of a second material formed over the feature. The semiconductor structure is exposed to an etchant. The etchant is adapted to selectively remove the first material, leaving the second material substantially intact. After exposing the semiconductor structure to the etchant, it is detected whether the feature has been affected by the etchant.
AbstractList A method comprises providing a semiconductor structure. The semiconductor structure comprises a feature comprising a first material and a layer of a second material formed over the feature. The semiconductor structure is exposed to an etchant. The etchant is adapted to selectively remove the first material, leaving the second material substantially intact. After exposing the semiconductor structure to the etchant, it is detected whether the feature has been affected by the etchant.
Author MEYER MORITZ ANDREAS
KOSCHINSKY FRANK
LANGER ECKHARD
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RelatedCompanies ADVANCED MICRO DEVICES, INC
MEYER MORITZ ANDREAS
KOSCHINSKY FRANK
LANGER ECKHARD
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Snippet A method comprises providing a semiconductor structure. The semiconductor structure comprises a feature comprising a first material and a layer of a second...
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SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title Method of testing an integrity of a material layer in a semiconductor structure
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