Partially and fully silicided gate stacks

Metal-oxide semiconductor (MOS) devices and techniques for the fabrication thereof are provided. In one aspect, a metal-oxide semiconductor device is provided comprising a substrate; and at least one n-channel field effect transistor (NFET) having a gate stack over the substrate. The NFET gate stack...

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Bibliographic Details
Main Authors SLEIGHT JEFFREY W, CHANG LELAND, MO RENEE TONG
Format Patent
LanguageEnglish
Published 14.06.2011
Subjects
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