Multi-thickness semiconductor with fully depleted devices and photonic integration

Techniques are disclosed that facilitate fabrication of semiconductors including structures and devices of varying thickness. One embodiment provides a method for semiconductor device fabrication that includes thinning a region of a semiconductor wafer upon which the device is to be formed thereby d...

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Bibliographic Details
Main Authors POMERENE ANDREW T S, CONWAY TIMOTHY J, HILL CRAIG M, CAROTHERS DANIEL N, VU VU A
Format Patent
LanguageEnglish
Published 19.04.2011
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