Apparatus and methods of defining spectral regions of interest for signal analysis

Apparatus and methods are provided to allow multiple, possibly overlapping, regions of interest within a frequency spectrum to be defined, and managed. Each of these regions of interest may be selected for further testing or identification. Unselected regions are allowed to collapse into narrow bars...

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Bibliographic Details
Main Authors LARRICK RONALD J, NICHOLLS RICHARD B, FITZSIMMONS LYNNE A, STRAND WALTER R, SHORT, III JOHN F, SCHMIDT DAVID W
Format Patent
LanguageEnglish
Published 05.04.2011
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:Apparatus and methods are provided to allow multiple, possibly overlapping, regions of interest within a frequency spectrum to be defined, and managed. Each of these regions of interest may be selected for further testing or identification. Unselected regions are allowed to collapse into narrow bars so as not to interfere with the selected region. Multiple rows are provided to allow for the definition and selection of overlapping regions of interest. Furthermore, in some embodiments aid is provided for identifying the signal type by providing a list of signal type candidates based upon such parameters as region of interest bandwidth, region of interest center frequency and geographic location.
Bibliography:Application Number: US20080174588