Abstract The present disclosure is directed to a method for preparing photomask patterns for a lithography process that employs a plurality of photomasks. The method comprises receiving data describing a drawn pattern. An edge of the drawn pattern is identified that can be defined using a first photomask and a second photomask, and the first photomask is chosen for patterning the edge. Patterns are formed for the first photomask and the second photomask, wherein the first photomask pattern is formed to pattern the edge, and the second photomask pattern is formed to have a wing adjacent to the edge for protecting the edge from double patterning. A process for patterning an integrated circuit device is also disclosed.
AbstractList The present disclosure is directed to a method for preparing photomask patterns for a lithography process that employs a plurality of photomasks. The method comprises receiving data describing a drawn pattern. An edge of the drawn pattern is identified that can be defined using a first photomask and a second photomask, and the first photomask is chosen for patterning the edge. Patterns are formed for the first photomask and the second photomask, wherein the first photomask pattern is formed to pattern the edge, and the second photomask pattern is formed to have a wing adjacent to the edge for protecting the edge from double patterning. A process for patterning an integrated circuit device is also disclosed.
Author ATON THOMAS J
VICKERY CARL A
Author_xml – fullname: VICKERY CARL A
– fullname: ATON THOMAS J
BookMark eNrjYmDJy89L5WRQD64sLknNVUjMS1HITS3JyE9RSMsvUshNzM7MS1coyMgvyc9NLM4u5mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8aHB5pYGZkamxk5GxkQoAQA6iil-
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID US7906253B2
GroupedDBID EVB
ID FETCH-epo_espacenet_US7906253B23
IEDL.DBID EVB
IngestDate Fri Jul 19 12:30:29 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US7906253B23
Notes Application Number: US20070863753
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110315&DB=EPODOC&CC=US&NR=7906253B2
ParticipantIDs epo_espacenet_US7906253B2
PublicationCentury 2000
PublicationDate 20110315
PublicationDateYYYYMMDD 2011-03-15
PublicationDate_xml – month: 03
  year: 2011
  text: 20110315
  day: 15
PublicationDecade 2010
PublicationYear 2011
RelatedCompanies TEXAS INSTRUMENTS INCORPORATED
RelatedCompanies_xml – name: TEXAS INSTRUMENTS INCORPORATED
Score 2.7474446
Snippet The present disclosure is directed to a method for preparing photomask patterns for a lithography process that employs a plurality of photomasks. The method...
SourceID epo
SourceType Open Access Repository
SubjectTerms APPARATUS SPECIALLY ADAPTED THEREFOR
AUXILIARY PROCESSES IN PHOTOGRAPHY
CINEMATOGRAPHY
ELECTROGRAPHY
GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHIC PROCESSES, e.g. CINE, X-RAY, COLOUR,STEREO-PHOTOGRAPHIC PROCESSES
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES
PHYSICS
TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
TECHNICAL SUBJECTS COVERED BY FORMER USPC
TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Title System and method for making photomasks
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110315&DB=EPODOC&locale=&CC=US&NR=7906253B2
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1ZS8NAEB5KPd80KtaLfZD4tGiSTZo-BCEXReiBbaRvZTcHFjENJuLfd7Jpqi_6tDALswfMsbMz8wHcJrY-sLnGKWNJQhnXBOUiy2giHnRuG8yyZCHtaGwNI_a0MBcdWLW1MLJP6JdsjogSFaO8V1JfFz9BLF_mVpb3YoWk9WM4d3w1acN9NWiB6rtOMJ34E0_1PCeaqeNnp1_34zUNF7X1Do5Wnf0XvLh1UUrx26KER7A7RWZ5dQydNFfgwGuB1xTYH23-uxXYkwmacYnEjRCWJ3DXdBknPE9IAwBN0PMk7xJXihSv66rO-XkrT4GEwdwbUlx7uT3nMpptd2mcQRef_-k5EGYZIrVsW5hMR0tSI4Nl6SDW-xpH98DMetD7k83FP3OXcNjERw2qmVfQrT4-02s0sJW4kVfzDfNfftE
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8JAEJ4QfOBNUQM-92DqqZG221IOjQktDSotRMBwI7t9RGIsja3x7zu7PPSi191k9pHMY2dnvg_gJrb1js00plIaxyplGlcZT1M15i2d2Qa1LNlIG4RWf0ofZ-asAotNL4zECf2S4IioURHqeyntdf6TxPJkbWVxxxc4tLz3J46nxJt0nyAtULyu0xsNvaGruK4zHSvhs9MWeLym0UVrvYMq1RLVf72XrmhKyX97FP8QdkcoLCuPoJJkdai5G-K1OuwH6__uOuzJAs2owMG1EhbHcLtCGScsi8mKAJpg5EneJa8UyV-Xpaj5eStOgPi9idtXce359pzz6Xi7S-MUqvj8TxpAqGXwxLJtblIdPYlgBkuTTqS3NYbhgZk2ofmnmLN_5q6h1p8Eg_ngIXw6h4NVrtRQNfMCquXHZ3KJzrbkV_KavgEGj4G7
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=System+and+method+for+making+photomasks&rft.inventor=VICKERY+CARL+A&rft.inventor=ATON+THOMAS+J&rft.date=2011-03-15&rft.externalDBID=B2&rft.externalDocID=US7906253B2