Fuse link structures using film stress for programming and methods of manufacture
A method of forming a programmable fuse structure includes forming at least one shallow trench isolation (STI) in a substrate, forming an e-fuse over the at least one STI and depositing an interlevel dielectric (ILD) layer over the e-fuse. Additionally, the method includes removing at least a portio...
Saved in:
Main Authors | , , , |
---|---|
Format | Patent |
Language | English |
Published |
22.02.2011
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | A method of forming a programmable fuse structure includes forming at least one shallow trench isolation (STI) in a substrate, forming an e-fuse over the at least one STI and depositing an interlevel dielectric (ILD) layer over the e-fuse. Additionally, the method includes removing at least a portion of the at least one STI under the e-fuse to provide an air gap below a portion of the e-fuse and removing at least a portion of the ILD layer over the e-fuse to provide the air gap above the portion of the e-fuse. |
---|---|
AbstractList | A method of forming a programmable fuse structure includes forming at least one shallow trench isolation (STI) in a substrate, forming an e-fuse over the at least one STI and depositing an interlevel dielectric (ILD) layer over the e-fuse. Additionally, the method includes removing at least a portion of the at least one STI under the e-fuse to provide an air gap below a portion of the e-fuse and removing at least a portion of the ILD layer over the e-fuse to provide the air gap above the portion of the e-fuse. |
Author | GAMBINO JEFFREY P PETRARCA KEVIN S BARTH KARL W LEE TOM C |
Author_xml | – fullname: BARTH KARL W – fullname: LEE TOM C – fullname: PETRARCA KEVIN S – fullname: GAMBINO JEFFREY P |
BookMark | eNqNizsOwjAQBV1Awe8OewEaIwFpQUS0CKijVbIOFvau5bXvj4I4ANWTZuYtzYyFaWFubVWC4PkNWnLtS82kUNXzCM6HOFFSBScZUpYxY4yTQx4gUnnJoCAOInJ1-H2vzdxhUNr8dmWgvTzO1y0l6UgT9sRUuuf9cGxsY_cnu_sj-QDghjnW |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences |
ExternalDocumentID | US7892926B2 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_US7892926B23 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 12:30:18 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_US7892926B23 |
Notes | Application Number: US20090508962 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110222&DB=EPODOC&CC=US&NR=7892926B2 |
ParticipantIDs | epo_espacenet_US7892926B2 |
PublicationCentury | 2000 |
PublicationDate | 20110222 |
PublicationDateYYYYMMDD | 2011-02-22 |
PublicationDate_xml | – month: 02 year: 2011 text: 20110222 day: 22 |
PublicationDecade | 2010 |
PublicationYear | 2011 |
RelatedCompanies | INTERNATIONAL BUSINESS MACHINES CORPORATION |
RelatedCompanies_xml | – name: INTERNATIONAL BUSINESS MACHINES CORPORATION |
Score | 2.7986746 |
Snippet | A method of forming a programmable fuse structure includes forming at least one shallow trench isolation (STI) in a substrate, forming an e-fuse over the at... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | Fuse link structures using film stress for programming and methods of manufacture |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110222&DB=EPODOC&locale=&CC=US&NR=7892926B2 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR1LS8Mw-GNMUW86FeeLHKS3orZb20sR-mIIe-hW2W0kbSqFtR20xb_vl7SdXvQSQkJCvpDv_QjAg8GYYekWU6MkpqqojqJSTpkaM6qbMccXLT2m05kxCUev6_G6B2mXCyPrhH7J4oiIURHieyXp9e7HiOXJ2MrykaU4VLwEK9tT4s7cJ_QXxXNsfzH35q7iuna4VGbvtmmhHKAZDlLrA5SiTYEM_ocjklJ2vzlKcAqHC9wsr86gx_MBHLvdx2sDOJq2_m7stqhXnsNbUJecCH8raWq-1qgoExG2_kmSdJuRJuuDoBBK2qCrTMzRPCbNN9ElKRKS0bwWyQy4-gJI4K_ciYpn2-zvYRMu91Dol9DPi5xfAeHU1HQ2eqbYoHY2ppGePKFQh4oMZ3RkDmH45zbX_8zdwEljP9VUTbuFPoLG75ABV-xeXt03KqaNPg |
link.rule.ids | 230,309,783,888,25576,76876 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR1NT4Mw9GWZxnnTqXF-9mC4ERUYcCEmwAjq2KbbzG5LO8pCIrAEiH_fV2DTi16apk2bvqbv-6MAdzpjuqmaTF5FIZVFdRSZcsrkkFHVCDm-6MpjGox0f669LPqLFsTbXJiqTuhXVRwRMWqF-F5U9HrzY8Ryq9jK_J7FOJQ9eTPLlcKtuU_oL5JrW4PJ2B07kuNY86k0ercME-UARbeRWu-hhG0IZBh82CIpZfObo3hHsD_BzdLiGFo87ULH2X681oWDoPF3Y7dBvfwE3rwy50T4W0ld87VERZmIsPU1ieLPhNRZHwSFUNIEXSVijqYhqb-JzkkWkYSmpUhmwNWnQLzBzPFlPNtydw_L-XQHhXoG7TRL-TkQTg1FZdojxQa1sz5dqdEDCnWoyHBGNaMHvT-3ufhn7hY6_iwYLofPo9dLOKxtqYqsKFfQRjD5NTLjgt1U1_gN9tGQMQ |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Fuse+link+structures+using+film+stress+for+programming+and+methods+of+manufacture&rft.inventor=BARTH+KARL+W&rft.inventor=LEE+TOM+C&rft.inventor=PETRARCA+KEVIN+S&rft.inventor=GAMBINO+JEFFREY+P&rft.date=2011-02-22&rft.externalDBID=B2&rft.externalDocID=US7892926B2 |