Laser targeting mechanism

• Main Authors: UZDANOVICH STEVE, VAYNER VLADIMIR
• Format: Patent
• Language: English
• Published: 07.12.2010
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

An automated test equipment system includes a peripheral including first mechanical alignment features; a test head including second mechanical alignment features arranged in a pattern corresponding to the first mechanical alignment features and configured to engage the first mechanical alignment fe...