Spin microscope based on optically detected magnetic resonance

• Main Authors: BERMAN GENNADY P, CHERNOBROD BORIS M
• Format: Patent
• Language: English
• Published: 13.07.2010
• Subjects: APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]; DETECTING MASSES OR OBJECTS; GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; SCANNING-PROBE TECHNIQUES OR APPARATUS; TESTING

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODM...