Microscopy arrangements and approaches

Light-field microscopy is facilitated using an approach to image computation. In connection with an example embodiment, a subject (e.g., 105) is imaged by passing light from the subject through a microlens array (e.g., 120) to a photosensor array (e.g., 130) to simultaneously detect light from the s...

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Main Authors NG YI-REN, LEVOY MARC S, HOROWITZ MARK A
Format Patent
LanguageEnglish
Published 25.05.2010
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
SEMICONDUCTOR DEVICES
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Abstract Light-field microscopy is facilitated using an approach to image computation. In connection with an example embodiment, a subject (e.g., 105) is imaged by passing light from the subject through a microlens array (e.g., 120) to a photosensor array (e.g., 130) to simultaneously detect light from the subject that is passed through different directions to different locations. In certain embodiments, information from the detected light is used to compute refocused images, perspective images and/or volumetric datasets, from a single-shot photograph.
AbstractList Light-field microscopy is facilitated using an approach to image computation. In connection with an example embodiment, a subject (e.g., 105) is imaged by passing light from the subject through a microlens array (e.g., 120) to a photosensor array (e.g., 130) to simultaneously detect light from the subject that is passed through different directions to different locations. In certain embodiments, information from the detected light is used to compute refocused images, perspective images and/or volumetric datasets, from a single-shot photograph.
Author HOROWITZ MARK A
LEVOY MARC S
NG YI-REN
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Snippet Light-field microscopy is facilitated using an approach to image computation. In connection with an example embodiment, a subject (e.g., 105) is imaged by...
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SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
SEMICONDUCTOR DEVICES
Title Microscopy arrangements and approaches
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