Positioning device for a test element

The invention relates an analysis system having a positioning device for positioning a test element and a method for positioning the test element in the analysis system. The positioning device has a support surface for supporting the test element. A first switch component sits on the support element...

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Bibliographic Details
Main Authors SCHABBACH MICHAEL, HUEBNER UTE, KERN BERNHARD, STENKAMP BERND
Format Patent
LanguageEnglish
Published 10.03.2009
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:The invention relates an analysis system having a positioning device for positioning a test element and a method for positioning the test element in the analysis system. The positioning device has a support surface for supporting the test element. A first switch component sits on the support element. A second switch component is positioned parallel to the first switch component. A connection is established when the second switch component is positioned in recess on the test element due to the displacement of the second switch component relative to the first switch component.
Bibliography:Application Number: US20040922638