Tunable laser for dynamic measurement
A method for monitoring changes in a gap which corresponds to changes in a particular environmental parameter using a tunable laser and interferometer at high frequency is disclosed. The laser light provided to the interferometer is swept through a small range of wavelengths. Light modulated by the...
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Format | Patent |
Language | English |
Published |
28.10.2008
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Subjects | |
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Abstract | A method for monitoring changes in a gap which corresponds to changes in a particular environmental parameter using a tunable laser and interferometer at high frequency is disclosed. The laser light provided to the interferometer is swept through a small range of wavelengths. Light modulated by the interferometer is detected and a non-sinusoidal light intensity output curve is created, a reference point on the curve identified and subsequent sweep of the laser performed. The difference in time, wavelength, or frequency at the occurrence of the reference point between the two sweeps allows for measuring the relative changes in the gap and, as a result, the change in the environmental parameter. |
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AbstractList | A method for monitoring changes in a gap which corresponds to changes in a particular environmental parameter using a tunable laser and interferometer at high frequency is disclosed. The laser light provided to the interferometer is swept through a small range of wavelengths. Light modulated by the interferometer is detected and a non-sinusoidal light intensity output curve is created, a reference point on the curve identified and subsequent sweep of the laser performed. The difference in time, wavelength, or frequency at the occurrence of the reference point between the two sweeps allows for measuring the relative changes in the gap and, as a result, the change in the environmental parameter. |
Author | LOPUSHANSKY RICHARD L JEFFERS LARRY A BERTHOLD JOHN W |
Author_xml | – fullname: JEFFERS LARRY A – fullname: BERTHOLD JOHN W – fullname: LOPUSHANSKY RICHARD L |
BookMark | eNrjYmDJy89L5WRQDSnNS0zKSVXISSxOLVJIyy9SSKnMS8zNTFbITU0sLi1KzU3NK-FhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGhweYmJsamhgZORsZEKAEA3scowA |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
ExternalDocumentID | US7443510B2 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_US7443510B23 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 12:02:27 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_US7443510B23 |
Notes | Application Number: US20050314952 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081028&DB=EPODOC&CC=US&NR=7443510B2 |
ParticipantIDs | epo_espacenet_US7443510B2 |
PublicationCentury | 2000 |
PublicationDate | 20081028 |
PublicationDateYYYYMMDD | 2008-10-28 |
PublicationDate_xml | – month: 10 year: 2008 text: 20081028 day: 28 |
PublicationDecade | 2000 |
PublicationYear | 2008 |
RelatedCompanies | DAVIDSON INSTRUMENTS INC |
RelatedCompanies_xml | – name: DAVIDSON INSTRUMENTS INC |
Score | 2.715026 |
Snippet | A method for monitoring changes in a gap which corresponds to changes in a particular environmental parameter using a tunable laser and interferometer at high... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
Title | Tunable laser for dynamic measurement |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081028&DB=EPODOC&locale=&CC=US&NR=7443510B2 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1bT4MwFD5Z5vVNUeO8pQ_KGxFK27EHYgKMLCa7xIHZ21IGJHtwLoPFv--hwuaLvrbJ6SX9zq09XwEeE84kt3PTSKnkBhNminpQOkYqqtOU2JZUVErDkRjE7HXGZy1YNrUwiif0S5EjIqIWiPdS6ev1PokVqLeVxXOyxKbPlzByA72Jjp3KXuqB5_Yn42Ds677vxlN99OZ2GfoFlumhtj5AL7qrYrZ3rypKWf-2KOEZHE5Q2Ko8h1a20uDEbz5e0-B4WN93a3CkHmguCmysQVhcwFO0VQVPBB3fbEPQ6yTpz7_y5GOf8bsEEvYjf2DgyPPdKufxdDdH-wraGPxn10B6Oc2tipLFoTZLe4g2mXAEjcUyQaVwOtD5U8zNP323cEprZlfq3EG73GyzezSvZfKgNuYbcvR9Kg |
link.rule.ids | 230,309,783,888,25577,76883 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1JT4NAFH5p6lJviprWdQ7KjQjD4vRATIAS1EIbC6a3BgokPVibQuPf9zFC60WvM8mbJfO9beZ9A3CX6Fqsq7kspTTWJc2QU9SDMZNSozpNiarEnErJDwwv0l6m-rQFi6YWhvOEfnFyRETUHPFecn292iWxHP62snhIFtj0-eSGpiM20TGr7KXoWOZgPHJGtmjbZjQRgzfzUUO_QJEt1NZ76GEzHim9W1VRyuq3RXGPYX-MwpblCbSypQAdu_l4TYBDv77vFuCAP9CcF9hYg7A4hftwwwueCDq-2Zqg10nSn3_lyccu43cGxB2EtifhyLPtKmfRZDtH9RzaGPxnXSD9nOZKRcnCqKqlfURbnOgIGkXLDBobrAe9P8Vc_NN3Cx0v9Iez4XPweglHtGZ5pewK2uV6k12jqS2TG75J33j2gBo |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Tunable+laser+for+dynamic+measurement&rft.inventor=JEFFERS+LARRY+A&rft.inventor=BERTHOLD+JOHN+W&rft.inventor=LOPUSHANSKY+RICHARD+L&rft.date=2008-10-28&rft.externalDBID=B2&rft.externalDocID=US7443510B2 |