Contact resistance and capacitance for semiconductor devices
A method generates a design layout for an integrated circuit. A design is provided for an integrated circuit. Library cells are selected according to the design. The library cells are mapped into a chip area map. Unmapped cells are filled with filler cells. Critical cells of the library cells are se...
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| Main Authors | , , |
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| Format | Patent |
| Language | English |
| Published |
21.10.2008
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| Subjects | |
| Online Access | Get full text |
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| Abstract | A method generates a design layout for an integrated circuit. A design is provided for an integrated circuit. Library cells are selected according to the design. The library cells are mapped into a chip area map. Unmapped cells are filled with filler cells. Critical cells of the library cells are selected. The selected critical cells are altered with respect to contact resistance and/or contact capacitance. The map including the altered cells is provided as the design layout. |
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| AbstractList | A method generates a design layout for an integrated circuit. A design is provided for an integrated circuit. Library cells are selected according to the design. The library cells are mapped into a chip area map. Unmapped cells are filled with filler cells. Critical cells of the library cells are selected. The selected critical cells are altered with respect to contact resistance and/or contact capacitance. The map including the altered cells is provided as the design layout. |
| Author | SAVITHRI NAGARAJ N GURUMURTHY GIRISHANKAR SHAH DHARIN NAYESHBHAI |
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| Snippet | A method generates a design layout for an integrated circuit. A design is provided for an integrated circuit. Library cells are selected according to the... |
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| SubjectTerms | CALCULATING CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION ORPROCESSING OF GOODS COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS PHYSICS TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE |
| Title | Contact resistance and capacitance for semiconductor devices |
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