Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devices

A method and apparatus for detecting open defects on grounded nodes of an electrical device using capacitive lead frame technology is presented. In accordance with the method of the invention, an accessible signal node that is capacitively coupled the grounded node is stimulated with a known source...

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Bibliographic Details
Main Authors JACOBSEN CHRIS R, PARKER KENNETH P
Format Patent
LanguageEnglish
Published 11.12.2007
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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