Layout generation and optimization to improve photolithographic performance
Disclosed are a system and method for designing a mask layout. In one example, the method includes representing the mask layout using a plurality of pixels, each having a mask transmittance coefficient. A control parameter is initialized and a representative of the mask layout is generated. The meth...
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Main Authors | , , , |
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Format | Patent |
Language | English |
Published |
04.09.2007
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Subjects | |
Online Access | Get full text |
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