Layout generation and optimization to improve photolithographic performance

Disclosed are a system and method for designing a mask layout. In one example, the method includes representing the mask layout using a plurality of pixels, each having a mask transmittance coefficient. A control parameter is initialized and a representative of the mask layout is generated. The meth...

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Bibliographic Details
Main Authors SHIN JAW JUNG, GAU TSAI SHENG, CHOU SHOU YEN, LIN BURN JENG
Format Patent
LanguageEnglish
Published 04.09.2007
Subjects
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